The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2009

Filed:

Nov. 23, 2005
Applicants:

Nobuharu Nagaoka, Nasukarasuyama, JP;

Masakazu Saka, Utsunomiya, JP;

Masahito Watanabe, Utsunomiya, JP;

Inventors:

Nobuharu Nagaoka, Nasukarasuyama, JP;

Masakazu Saka, Utsunomiya, JP;

Masahito Watanabe, Utsunomiya, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06K 9/40 (2006.01); H04N 15/00 (2006.01); H04N 13/00 (2006.01); H04N 9/47 (2006.01); H04N 7/00 (2006.01); H04N 7/18 (2006.01); G01B 11/14 (2006.01); G01D 18/00 (2006.01); G12B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Two aiming targets are arranged at positions that are away from two infrared cameras by a predetermined distance. One of the infrared cameras images one of the aiming targets, and the other of the infrared cameras images the other of the aiming targets. Assuming that the obtained images relate to an image of one aiming target, a parallax offset value is calculated. The correction of position is performed based on the parallax offset value.


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