The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2009
Filed:
Sep. 10, 2004
Minoru Sodeura, Ebina, JP;
Satoshi Mizuhashi, Ebina, JP;
Yasuhisa Mizuta, Ebina, JP;
Yoshitake Matsubara, Ebina, JP;
Sadao Furuoya, Ebina, JP;
Ayumi Onishi, Ebina, JP;
Masato Saito, Ebina, JP;
Hiroshi Hagiwara, Ebina, JP;
Minoru Sodeura, Ebina, JP;
Satoshi Mizuhashi, Ebina, JP;
Yasuhisa Mizuta, Ebina, JP;
Yoshitake Matsubara, Ebina, JP;
Sadao Furuoya, Ebina, JP;
Ayumi Onishi, Ebina, JP;
Masato Saito, Ebina, JP;
Hiroshi Hagiwara, Ebina, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
An image reading apparatus includes: a light source that irradiates a document; a sensor that receives reflection light reflected from the document; a reference member that is read by the sensor; and an abnormal site detection unit that detects, using first reading data acquired by reading the reference member according to a first reading condition set to the light source or the sensor and second reading data acquired by reading the reference member according to a second reading condition, which is different from the first reading condition, set to the light source or the sensor, abnormal sites in the first reading data or the second reading data.