The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2009
Filed:
Jun. 07, 2006
Gap Youl Lyu, Irvine, CA (US);
Kilhun Koo, Northridge, CA (US);
Min Hee Kang, Irvine, CA (US);
BA Cao, Simi Valley, CA (US);
Gap Youl Lyu, Irvine, CA (US);
Kilhun Koo, Northridge, CA (US);
Min Hee Kang, Irvine, CA (US);
Ba Cao, Simi Valley, CA (US);
Raybit Systems Inc., Santa Ana, CA (US);
Abstract
The present invention relates to a light wavelength and intensity measuring device. The device automatically measures a center wavelength of the light source and an intensity of the light corresponding to the center wavelength by using a main photodetector, at least one optical filter, and at least one sub photodetector when the light source is connected to the device. The main photodetector detects the intensity of the light applied by the light source, the optical filter transmits the light corresponding to a prediscriminated transmission wavelength, and the sub photodetector detects the intensity of the light transmitted through the optical filter. Therefore, the light intensity is more accurately measured by calibrating the intensity according to the wavelength.