The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2009
Filed:
Jun. 10, 2005
Borja Sepulveda Martinez, Madrid, ES;
Gaspar Armelles Reig, Madrid, ES;
Laura M. Lechuga Gomez, Madrid, ES;
Ana Calle Martin, Madrid, ES;
Borja Sepulveda Martinez, Madrid, ES;
Gaspar Armelles Reig, Madrid, ES;
Laura M. Lechuga Gomez, Madrid, ES;
Ana Calle Martin, Madrid, ES;
Consejo Superior de Investigaciones Cientificas, Madrid, ES;
Abstract
The device for detecting changes in the refractive index of a dielectric medium comprises: at least one metallic layer () ready to be placed in contact with the dielectric medium (); at least one light source () configured to direct transversal magnetic (TM) polarized light towards such metallic layer, so that the light is reflected on such metallic layer; coupling means (); and at least one detector () configured to receive light reflected by the metallic layer and to detect at least one feature of such light. According to the invention, the metallic layer contains a ferromagnetic material. The invention also relates to a method.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile