The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2009

Filed:

Nov. 28, 2005
Applicants:

Masakazu Saka, Utsunomiya, JP;

Nobuharu Nagaoka, Nasukarasuyama, JP;

Masahito Watanabe, Utsunomiya, JP;

Hideki Hashimoto, Utsunomiya, JP;

Inventors:

Masakazu Saka, Utsunomiya, JP;

Nobuharu Nagaoka, Nasukarasuyama, JP;

Masahito Watanabe, Utsunomiya, JP;

Hideki Hashimoto, Utsunomiya, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An abnormality detecting apparatus for an imaging apparatus that detects a presence of abnormalities in imaging apparatuses mounted on a vehicle to capture vehicle surroundings, which includes: a luminance variance value calculating device that calculates a luminance variance value of each image from the imaging apparatuses using the luminance value of each image from the imaging apparatuses obtained by the imaging apparatuses; and an abnormality detecting device that detects the presence of abnormalities in any of the imaging apparatuses in accordance with the luminance variance values calculated by the luminance variance value calculating device.


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