The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2009
Filed:
Nov. 15, 2006
Haruhiko Miyagawa, Kyoto, JP;
Haruhiko Miyagawa, Kyoto, JP;
Shimadzu Corporation, Kyoto-fu, JP;
Abstract
When a standard specimen including a given reference component is analyzed after a separation condition is changed, a data processing section () acquires an actual measurement value of a peak of a reference component that appears in a chromatogram obtained by the analysis, and estimates a deviation of the retention time of a peak of an intended component on the basis of the actual measurement value and information on the retention time of the reference component before the separation condition stored in an analysis condition information storing section () is changed, to correct a measurement time range of the respective ion sets of an SIM measurement parameter which is stored in an analysis condition information storing section (). An SIM measurement is conducted according to the parameter that is corrected when analyzing the intended specimen, to thereby make it possible to conduct a desired measurement by an operator.