The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2009

Filed:

Oct. 04, 2004
Applicants:

Igal Ladabaum, San Carlos, CA (US);

Satchi Panda, Fremont, CA (US);

Christopher M Daft, Pleasanton, CA (US);

Inventors:

Igal Ladabaum, San Carlos, CA (US);

Satchi Panda, Fremont, CA (US);

Christopher M Daft, Pleasanton, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A capacitive microfabricated transducer array used for 3-D imaging, with a relatively large elevation dimension and a bias control of the elevation aperture in space and time, confers the same benefits of mechanical translation, except that image cross-sections are electronically rather than mechanically scanned, and are registered very accurately in space. The 3-D cMUT, when combined with elevation bias control and convex curvature in elevation, increases the volume interrogated by the electronic scanning, thus improving field of view. Further still, the 3-D cMUT can be combined Fresnel focusing of the elevation section to improve the elevation focus.


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