The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2009
Filed:
Mar. 06, 2006
Applicants:
Hien T. Bui, Kent, WA (US);
Dennis P. Sarr, Kent, WA (US);
Inventors:
Hien T. Bui, Kent, WA (US);
Dennis P. Sarr, Kent, WA (US);
Assignee:
The Boeing Company, Chicago, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
Apparatus, systems, and methods for inspecting a structure are provided which use a sensor holder, which is configured to support one or more curved linear inspection sensors and may be constructed from rapid prototyping, such as stereolithography. Integrated curved linear ultrasonic transducer inspection apparatus, systems, and methods provide fast and efficient methods of constructing custom inspection devices and inspecting otherwise difficult-to-inspect curved radius features of structures, such as a corner of a hat stringer.