The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2009
Filed:
Nov. 30, 2006
Chanmin Su, Ventura, CA (US);
Craig Prater, Goleta, CA (US);
Gregory F. Meyers, Midland, MI (US);
Bryant R. Lafreniere, Midland, MI (US);
Chanmin Su, Ventura, CA (US);
Craig Prater, Goleta, CA (US);
Gregory F. Meyers, Midland, MI (US);
Bryant R. LaFreniere, Midland, MI (US);
The Dow Chemical Company, Midland, MI (US);
Veeco Instruments Inc., Plainview, NY (US);
Abstract
A method and apparatus for its practice are provided of differentiating at least one component of a heterogeneous sample from other component(s) using harmonic resonance imaging and of obtaining information regarding the sample from the differentiation. In a preferred embodiment, an image is created of a property of a harmonic or a combination of a harmonics producing a response having a contrast factor between the sample's constituent components. The desired harmonic(s) can be identified either in a preliminary data acquisition procedure on the sample or, if the sample's constituent components are known in advance, predetermined. The desired harnonic(s) may be identified directly by the user or automatically through, e.g., pattern recognition. A compositional map may then be generated and displayed and/or additional information about the sample may be obtained.