The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2009

Filed:

Oct. 14, 2004
Applicants:

Mitsuhiko Sano, Tokyo, JP;

Kazuhiro Ohara, Tokyo, JP;

Masashi Tsugeno, Tokyo, JP;

Inventors:

Mitsuhiko Sano, Tokyo, JP;

Kazuhiro Ohara, Tokyo, JP;

Masashi Tsugeno, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B21B 37/16 (2006.01); B21B 37/00 (2006.01); B21B 37/44 (2006.01); B21B 37/74 (2006.01); B21B 38/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention matches the material quality of a product to target data, even when a materials quality model is insufficient in prediction accuracy. Heating a metallic material, rolling, forging, or leveling the metallic material, and cooling the metallic material are each conducted at least once. Prior to manufacture of a metallic product of a desired size and shape, qualitative data of the metallic material are measured at a position by materials, quality sensor in a manufacturing line, and modifications based on measured data are made to heating, processing, or cooling conditions in at least one of the steps, upstream of the materials measured data sensor so that the quality of the metallic material at the measuring position agrees with target data.


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