The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2009
Filed:
Aug. 23, 2006
Paul J. Smith, Colorado Springs, CO (US);
Brad D. Besmer, Colorado Springs, CO (US);
Guy W. Kendall, Colorado Springs, CO (US);
Paul J. Smith, Colorado Springs, CO (US);
Brad D. Besmer, Colorado Springs, CO (US);
Guy W. Kendall, Colorado Springs, CO (US);
LSI Corporation, Milpitas, CA (US);
Abstract
Circuits and associated methods for testing internal operation of an application integrated circuit. Features and aspects hereof add configurable test interrupt circuits to an application circuit design to permit dynamic, configurable interrupt generation from an integrated circuit based on conditions determined from monitoring of internal signals of the application circuit. The internal signals that may be tested and used to generate test interrupts are those not exposed to the external processor interface of the integrated circuit and thus may be configured to interrupt based on any internal state of the application specific functional circuits of the integrated circuit.