The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2009

Filed:

Dec. 11, 2003
Applicant:

Moon-chol Park, Suwon-si, KR;

Inventor:

Moon-chol Park, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for managing random-directional scratches on a hard disk. The apparatus includes a scratch determination unit and an alleged defect setting unit. The scratch determination unit determines that predetermined sectors are affected by a single continuous scratch if the predetermined sectors are defective and a distance therebetween is not larger than the length of a single continuous scratch. The alleged defect setting unit sets sectors between the predetermined sectors and around each of the predetermined sectors as alleged defective sectors if the defective sectors are determined to be affected by the single continuous scratch.


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