The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2009

Filed:

Apr. 14, 2004
Applicants:

Darin P. Haudrich, Waterloo, IL (US);

Dale M. Pitt, Affton, MO (US);

Inventors:

Darin P. Haudrich, Waterloo, IL (US);

Dale M. Pitt, Affton, MO (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06E 1/00 (2006.01); G06E 3/00 (2006.01); G06G 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method of performing aeroelastic analysis using a neural network. Input parameters, such as mass and location, contributing to aeroelastic characterization are determined and constrained. A model of a structure to be analyzed can be constructed. The model can include a number of locations where the input parameters can be varied. The aeroelastic characteristic of the structure can be analyzed using a finite element model to determine a number of output characteristics, each of which can correspond to at least one of a plurality of input samples. A neural network can be generated for determining the aeroelastic characteristic based on input parameters. The input sample/output characteristic pairs can be used to train the neural network. The weights and bias values from the trained neural network can be used to generate a non-linear transfer function that generates the aeroelastic characteristic in response to input parameters.


Find Patent Forward Citations

Haudrich, Darin. (2009). Neural network for aeroelastic analysis (U.S. Patent No. 7617166). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7617166

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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