The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2009
Filed:
Jan. 26, 2007
Dae-wook Kim, Seoul, KR;
Sang-hoon Lee, Anyang-si, KR;
Ji-seong Doh, Hwaseong-si, KR;
Moon-hyun Yoo, Suwon-si, KR;
Jong-bae Lee, Yongin-si, KR;
Dae-Wook Kim, Seoul, KR;
Sang-Hoon Lee, Anyang-si, KR;
Ji-Seong Doh, Hwaseong-si, KR;
Moon-Hyun Yoo, Suwon-si, KR;
Jong-Bae Lee, Yongin-si, KR;
Abstract
A method for estimating statistical distribution characteristics of physical parameters of a semiconductor device includes manufacturing a plurality of semiconductor device chips, each having a plurality of transistors, preparing electrical characteristic data by measuring electrical characteristics of the plurality of transistors included in the plurality of chips, extracting an inter-chip distribution characteristic and an intra-chip distribution characteristic of the electrical characteristics by analyzing the electrical characteristic data, generating random number data satisfying the extracted inter-chip and intra-chip distribution characteristics, and performing a simulation for extracting statistical distribution characteristic data of the physical parameters of the chips, based on the random number data.