The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2009

Filed:

Nov. 23, 2005
Applicants:

Nobuharu Nagaoka, Nasukarasuyama, JP;

Masakazu Saka, Utsunomiya, JP;

Masahito Watanabe, Utsunomiya, JP;

Inventors:

Nobuharu Nagaoka, Nasukarasuyama, JP;

Masakazu Saka, Utsunomiya, JP;

Masahito Watanabe, Utsunomiya, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06K 9/40 (2006.01); H04N 15/00 (2006.01); H04N 13/00 (2006.01); H04N 13/02 (2006.01); G01B 11/14 (2006.01); G01D 18/00 (2006.01); G12B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A first object and a second object arranged in an actual space with coordinates (Xn, Zn) and (Xn−D, Zn) are imaged, and respective coordinates xand xof the first object and the second object in the image are calculated. Then, a coordinate xof the first object in the image and a coordinate xof the second object in the image are calculated by equations:1=2=·()/where F is a design parameter of an imaging unit. An image distortion corrective value α to correct the design parameter F is calculated by equations:α·1*=1α·2*=2using a difference between the coordinates xand xand a difference between the coordinates xand x


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