The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2009
Filed:
Nov. 17, 2004
Kazunori Okada, Plainsboro, NJ (US);
Dorin Comaniciu, Princeton Jct., NJ (US);
Arun Krishnan, Exton, PA (US);
Kazunori Okada, Plainsboro, NJ (US);
Dorin Comaniciu, Princeton Jct., NJ (US);
Arun Krishnan, Exton, PA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
A method for determining a structure in volumetric data includes determining an anisotropic scale-space for a local region around a given spatial local maximum, determining L-normalized scale-space derivatives in the anisotropic scale-space, and determining the presence of noise in the volumetric data and upon determining noise in the volumetric data, determining the structure by a most-stable-over-scales determination, and upon determining noise below a desirable level, determining the structure by one of the most-stable-over-scales determination and a maximum-over-scales determination.