The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2009
Filed:
Jun. 30, 2004
Applicants:
Tobias Söderman, Bälinge, SE;
Mats Inganäs, Uppsala, SE;
Inventors:
Tobias Söderman, Bälinge, SE;
Mats Inganäs, Uppsala, SE;
Assignee:
Gyros Patent AB, Uppsala, SE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to a method, a system, a neural network and a computer program product for determining the quality of an analytical process, preferably the confidence value. The analytical process is performed in a microchannel structure of a microfluidic device, from which data information of the analytic process is acquired by scanning at least one search area of the microchannel structure for signal data. The search area comprises the result of the analytical process and the acquired data information is stored as an image, one image for each scanned search area.