The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2009
Filed:
Jul. 31, 2007
David J. Brady, Durham, NC (US);
Nikos Pitsianis, Durham, NC (US);
Xiaobai Sun, Durham, NC (US);
Prasant Potuluri, Durham, NC (US);
David J. Brady, Durham, NC (US);
Nikos Pitsianis, Durham, NC (US);
Xiaobai Sun, Durham, NC (US);
Prasant Potuluri, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
An optical wavemeter includes a slit, a diffraction grating, a mask, a complementary grating, and a detector. A monochromatic source is incident on the slit. The diffraction grating produces an image of the slit in an image plane at a horizontal position that is wavelength dependent. The mask has a two-dimensional pattern of transmission variations and produces different vertical intensity channels for different spectral channels. The complementary grating produces a stationary image of the slit independent of wavelength. The detector measures vertical variations in intensity of the stationary image, and the mask is created so that the number of measurements made by the detector is less than the number of spectral channels sampled.