The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2009

Filed:

Jan. 03, 2007
Applicants:

Susumu Kikuchi, Hachioji, JP;

Yoshihiro Kawano, Fuchu, JP;

Masahiro Oba, Fuchu, JP;

Inventors:

Susumu Kikuchi, Hachioji, JP;

Yoshihiro Kawano, Fuchu, JP;

Masahiro Oba, Fuchu, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 11/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides an examination apparatus including an objective optical system for positioning a focal point inside a specimen mounted on a stage; an image-acquisition apparatus for detecting light emitted in different optical-axis directions from the vicinity of the focal point inside the specimen and collected by the objective optical system to acquire a plurality of pieces of image information; and a three-dimensional image forming unit for forming a three-dimensional image of a light-emitting site in the vicinity of the focal point based on the plurality of pieces of image information acquired by the image-acquiring apparatus.


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