The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2009
Filed:
Jun. 13, 2008
Chul J. Lee, Lexington, MA (US);
Brian J. Harkins, Westford, MA (US);
Chul J. Lee, Lexington, MA (US);
Brian J. Harkins, Westford, MA (US);
Raytheon Company, Waltham, MA (US);
Abstract
A method to reduce scattering centers (SC) includes receiving a set of SC data points representing an object. The method also includes reducing SC data points associated with a first region based on magnitudes of intensity of the SC data points associated with the first region, reducing SC data points associated with a second region based on magnitudes of intensity of the SC data points associated with the second region, combining the reduced SC data points associated with the first region and the second region to form a reduced set of SC data points, comparing the reduced set of SC data points with the received set of SC data points to determine if the reduced set of SC data points meets a set of comparison metrics and if the reduced set of SC data points meets the set of comparison metrics, performing another iteration of the reducing.