The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2009
Filed:
Sep. 05, 2006
Trent Ridder, Woddbridge, VA (US);
Ben Ver Steeg, Redlands, CA (US);
James Mcnally, Albuquerque, NM (US);
John D. Maynard, Albuquerque, NM (US);
Russell E. Abbink, Sandia Park, NM (US);
Trent Ridder, Woddbridge, VA (US);
Ben ver Steeg, Redlands, CA (US);
James McNally, Albuquerque, NM (US);
John D. Maynard, Albuquerque, NM (US);
Russell E. Abbink, Sandia Park, NM (US);
TruTouch Technologies, Inc., Albuquerque, NM (US);
Abstract
The present invention relates generally to non-invasive methods and apparatuses for determining analyte properties of a subject and identity characteristics of a subject. Embodiments of the present invention provide analyte property determination and identity determination or verification from the same spectroscopic information, making unauthorized use or misleading results less likely that in systems that include separate analyte and identity determinations. The invention can be used to control and monitor individuals accessing controlled environments.