The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2009

Filed:

Feb. 14, 2006
Applicant:

Victor B. Kley, Berkeley, CA (US);

Inventor:

Victor B. Kley, Berkeley, CA (US);

Assignee:

General Nanotechnology, LLC, Berkeley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01N 23/00 (2006.01); G21K 7/00 (2006.01); H01J 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object.


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