The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2009
Filed:
Nov. 24, 2004
Bradford Ruffin Daniels, Redmond, WA (US);
John Dunagan, Bellevue, WA (US);
Roussi A. Roussev, Melbourne, FL (US);
Chad E. Verbowski, Redmond, WA (US);
Yi-min Wang, Bellevue, WA (US);
Bradford Ruffin Daniels, Redmond, WA (US);
John Dunagan, Bellevue, WA (US);
Roussi A. Roussev, Melbourne, FL (US);
Chad E. Verbowski, Redmond, WA (US);
Yi-Min Wang, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A method and system for analyzing the impact on software of an update to a software system is provided. The impact analysis system identifies resources that are affected by an update to the software system and identifies resources that are accessed by various software components during execution of the software components. To analyze the effects of an update, the impact analysis system identifies those accessed resources of the software components that are affected by the update as being impacted resources. The impact analysis system considers those software components that access the impacted resources to be impacted software components. The impact analysis system provides a user interface through which a user can view and analyze the impact of an update.