The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2009

Filed:

Feb. 07, 2006
Applicant:

Toshiharu Asaka, Kanagawa, JP;

Inventor:

Toshiharu Asaka, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor integrated circuit includes an input side flip-flop; a combinational circuit having an input connected with the input side flip-flop; an output side flip-flop connected with an output of the combinational circuit; and a delay test circuit. The delay test circuit generates output clock pulses by removing an optional one from equal to or more than 3 continuing clock pulses of an input clock signal, and supplies the output clock pulse to the input side flip-flop and the output side flip-flop.


Find Patent Forward Citations

Asaka, Toshiharu. (2009). Semiconductor integrated circuit with delay test circuit, and method for testing semiconductor integrated circuit (U.S. Patent No. 7613971). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7613971

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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