The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2009
Filed:
Jul. 06, 2005
Applicant:
Katsuya Ishikawa, Kawasaki, JP;
Inventor:
Katsuya Ishikawa, Kawasaki, JP;
Assignee:
Fujitsu Microelectronics Limited, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 27/28 (2006.01); G01R 31/00 (2006.01); G01R 31/14 (2006.01); G11C 29/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
In order to realize a JTAG test of a printed board including a semiconductor device having JTAG test unsupported input/output terminals inside thereof, one device is logically divided into two devices such as a JTAG test supported device and a JTAG test unsupported device, boundary scan FFs are inserted between the two devices to be combined with another device configured in the same way and the JTAG test unsupported parts of both devices are equivalently combined to be regarded as one JTAG test unsupported device. Then, this device is sandwiched by the JTAG test supported devices and a JTAG test is conducted.