The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2009

Filed:

Apr. 12, 2007
Applicants:

Kenny C. Gross, San Diego, CA (US);

Aleksey M. Urmanov, San Diego, CA (US);

Ramakrishna C. Dhanekula, San Diego, CA (US);

Steven F. Zwinger, Poway, CA (US);

Inventors:

Kenny C. Gross, San Diego, CA (US);

Aleksey M. Urmanov, San Diego, CA (US);

Ramakrishna C. Dhanekula, San Diego, CA (US);

Steven F. Zwinger, Poway, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system that monitors electromagnetic interference (EMI) signals to facilitate proactive fault monitoring in a computer system is presented. During operation, the system receives EMI signals from one or more antennas located in close proximity to the computer system. The system then analyzes the received signals to proactively detect anomalies during operation of the computer system.


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