The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2009
Filed:
Jan. 21, 2004
Applicants:
Hyung-sok Yeo, Suwon-si, KR;
Jeong-whan Lee, Suwon-si, KR;
Gil-won Yoon, Seoul, KR;
Hyun-tai Hwang, Yongin-si, KR;
Inventors:
Hyung-sok Yeo, Suwon-si, KR;
Jeong-whan Lee, Suwon-si, KR;
Gil-won Yoon, Seoul, KR;
Hyun-tai Hwang, Yongin-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of evaluating human stress using photoplethysmography (PPG) includes defining at least one PPG parameter, radiating light having at least one wavelength, which reacts to a blood component to be measured, at a measuring target and measuring a PPG signal from the measuring target during a predetermined period of time, and evaluating a level of human stress using a plurality of stress indexes obtained from the PPG parameter.