The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2009
Filed:
Aug. 07, 2007
Stephen Ronald Schroeder, Fort Collins, CO (US);
Stephen Ronald Schroeder, Fort Collins, CO (US);
Orbimage SI Opco, Inc., Dulles, VA (US);
Abstract
Method for warping first and second overlapping images includes selecting a first set of points in a first image, the first set of points being located in an overlap region between first and second images; selecting a set of tie points in the second image, including individual tie points each of which correlates to a point in the first set of points; selecting from the first image a patch including at least one point from the first set of points and at least one neighboring point; performing shadow detection to determine a percentage of the patch exceeding a predetermined percentage, thereby indicating a shadow; if so, eliminating the at least one point so that it is not correlated with any of the individual tie points, thereby avoiding correlating the shadow in the first image to a shadow in the second image.