The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2009
Filed:
Dec. 19, 2005
Jianying LI, New Berlin, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Melissa L. Vass, Milwaukee, WI (US);
Xiangyang Tang, Waukesha, WI (US);
John Howard Londt, Delafield, WI (US);
Darin Robert Okerlund, Muskego, WI (US);
Jianying Li, New Berlin, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Melissa L. Vass, Milwaukee, WI (US);
Xiangyang Tang, Waukesha, WI (US);
John Howard Londt, Delafield, WI (US);
Darin Robert Okerlund, Muskego, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for combining images acquired using helical half-scan imaging comprises identifying an image plane within an overlap region comprising data from first and second view streams representative of first and second cycles of acquired image data. The image plane comprises the same anatomical structure. First and second weighting functions are calculated for first and second images based on first and second tube positions of an x-ray tube. The first and second images correspond to the image plane and are from the first and second view streams, respectively. The first and second tube positions also correspond to the image plane. A weighted image is then formed based on the first and second weighting functions and the first and second images.