The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2009
Filed:
Jan. 12, 2006
Nobuhiro Takamizawa, Sagamihara, JP;
Nobuhiro Takamizawa, Sagamihara, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A scanning microscope includes a light source unit that projects laser light, an optical system that converges and applies the laser light onto data obtaining points on a specimen, and a data obtaining order deciding unit that decides a data obtaining order such that adjacent data obtaining points are not consecutive in the data obtaining order. A scanning unit scans the laser light in accordance with the data obtaining order, a detector detects detection light from the data obtaining points, respectively, and a storage unit stores luminance information on the detection light detected by the detector in association with positional information on the data obtaining points, respectively. An image formation unit forms a two-dimensional image based on the stored associated luminance and positional information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile