The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2009

Filed:

Nov. 27, 2006
Applicants:

Atsushi Fukunaga, Osaka, JP;

Eiji Noguchi, Osaka, JP;

Takahiro Nakaminami, Osaka, JP;

Inventors:

Atsushi Fukunaga, Osaka, JP;

Eiji Noguchi, Osaka, JP;

Takahiro Nakaminami, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); G01N 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement cellincludes: an opening partfor supplying a sample into a sample holding partfor holding a sample; an optical window portion for allowing light to enter the sample holding partand allowing light to exit the sample holding part; a protection coverfor protecting the optical window portion, provided along the circumference of the sample holding part; and a first protection-cover-holding partfor holding the protection coverat the position where the optical window portion is covered.


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