The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2009
Filed:
Mar. 08, 2007
Hegeon Kwun, San Antonio, TX (US);
Ronald H. Peterson, Helotes, TX (US);
Hegeon Kwun, San Antonio, TX (US);
Ronald H. Peterson, Helotes, TX (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
Systems and methods are described that carry out an intelligent, variable, time-gain control (TGC) of signal amplification in a long-range, guided-wave inspection and monitoring system. The systems and methods compensate for signal attenuation over the longer distances that guided-wave inspection techniques are capable of operating with. The sensor signal received is divided into relevant frequency bands that are each subjected to a variable TGC through separate variable gain amplifiers (VGAs). The gain selection is processor controlled through the use of a digital look-up table (LUT) stored with predetermined gain functions and/or data that are both time and frequency specific. The signal components are re-combined and digitized for further signal analysis and defect detection. The LUT is established through one or more methods including a weld signal amplitude equalization approach and a background noise equalization approach.