The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2009

Filed:

Jul. 08, 2005
Applicant:

Marcus Lagergren, Stockholm, SE;

Inventor:

Marcus Lagergren, Stockholm, SE;

Assignee:

BEA Systems, Inc., Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for iterative code optimization using adaptive or dynamic size metrics, for use with run-time software systems and virtual machines. The dynamic size metric may be calculated both for a set of predetermined factors (together with associated weights), and also for a set of variable factors determined during the runtime code introspection process. The predetermined factors, and their associated weights, may be varied to reflect the overall performance of the code in each optimization instance.


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