The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
Aug. 24, 2004
Greg Taillefer, Wrentham, MA (US);
David Karl Critz, Boston, MA (US);
Greg Taillefer, Wrentham, MA (US);
David Karl Critz, Boston, MA (US);
The Math Works, Inc., Natick, MA (US);
Abstract
Methods are provided to automatically generate, distribute and execute code locally and remotely. The test may therefore be performed using the automatically distributed code. Automated parameter mapping may be provided to couple parameters applicable to a test step with the test step. A test step in the test may therefore automatically include the coupled parameters. Data storage may be performed using a multidimensional parametric space. Each point in space may contain arbitrary nonscalar data which define an individual data workspace. These points can also be plotted against each other and overlayed to aid in visualization of multi-dimensional data.