The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
Nov. 17, 2006
Gwang Woo Park, Seoul, KR;
Young Han Kwon, Jinjoo-si, KR;
Kyoung Choi, Seoul, KR;
Seung Hwan OH, Seoul, KR;
Sang Hee Shin, Seoul, KR;
Dong Jin Kang, Anyang-si, KR;
Gwang Woo Park, Seoul, KR;
Young Han Kwon, Jinjoo-si, KR;
Kyoung Choi, Seoul, KR;
Seung Hwan Oh, Seoul, KR;
Sang Hee Shin, Seoul, KR;
Dong Jin Kang, Anyang-si, KR;
National Arboretum, Korea Forest Service, Pocheon-Si, Gyeonggi-Do, KR;
Abstract
A method for quantifying plant resource using a GIS is disclosed, in which it is possible to more efficiently quantify plant resources with less manpower, time and cost using a GIS when quantifying plant resources in a certain region. In the method, a sample group is extracted from mother groups having a plurality of distribution maps having a plurality of environment factors including IMI as attribute data, the IMI being obtained through a GIS preprocess. A relative model formula is obtained between a plant resource real measurement value of the sample group and an environment factor real measurement value and is related with the distribution map of the mother group, and the distribution maps are overlapped for thereby forming a plant resource estimation distribution map of the mother group.