The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2009

Filed:

Oct. 22, 2007
Applicants:

Kenny C. Gross, San Diego, CA (US);

Keith A. Whisnant, San Diego, CA (US);

Inventors:

Kenny C. Gross, San Diego, CA (US);

Keith A. Whisnant, San Diego, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G21C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system that diagnoses a failure in a computer system is described. During operation, the system tests the computer system using a sequence of tests, where a given test includes a given load associated with a pre-determined failure mechanism for a given failure condition. During the given test, the system obtains results, which include telemetry signals that are monitored within the computer system. If the results indicate the given failure condition, the system ceases the testing and indicates that the computer system has the given failure condition. Otherwise, the system continues the sequence of tests until the sequence is completed, at which point, if no fault has been detected, the system indicates that a no-trouble-found (NTF) condition exists.


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