The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7610169 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 27, 2009

Filed:

Jun. 04, 2007
Applicant:

Teruyoshi Washizawa, Atsugi, JP;

Inventor:

Teruyoshi Washizawa, Atsugi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A variance-covariance matrix of a matrix having a combination of multivariate data and objective variables is obtained, and multiple eigenvalues and their corresponding eigenvectors are calculated by eigenvalue decomposition of the variance-covariance matrix. Accumulated contributions are calculated from the multiple eigenvalues in descending order of absolute value of the eigenvalues. Regression coefficients are calculated from eigenvalues and eigenvectors that correspond to accumulated contributions that exceed a predetermined value.


Find Patent Forward Citations

Washizawa, Teruyoshi. (2009). Regression analysis apparatus and method (U.S. Patent No. 7610169). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7610169

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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