The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2009

Filed:

Aug. 21, 2003
Applicants:

Yasuo Isumi, Aichi-ken, JP;

Kou Hirano, Mie-ken, JP;

Inventors:

Yasuo Isumi, Aichi-ken, JP;

Kou Hirano, Mie-ken, JP;

Assignees:

Toyota Jidosha Kabsuhki Kaisha, Toyota-shi, Aichi-ken, JP;

Nagoya Electric Works Co. Ltd., Nagoya-shi, Aichi-ken, unknown;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

If a threshold discrimination is performed with variable Z=0 using discriminant analysis, that is useless unless know-how is accumulated through visual judgment and actual operation. A discriminant function is computed using a plurality of parameters which make pass/fail judgment factors and the results of that pass/fail judgment. With respect to the discriminant function, a histogram is generated for pass category and for fail category. Then, a threshold is determined based on the standard deviation in the individual categories so that an intended rate of flowout and rate of overcontrol will be obtained. The acceptability of pass/fail judgment objects is judged based on the threshold. Thus, the rate of flowout and the rate of overcontrol can be controlled as intended. Further, high-performance pass/fail judgment can be implemented without accumulating know-how.


Find Patent Forward Citations

Loading…