The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7610160 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 27, 2009

Filed:

Sep. 18, 2007
Applicants:

Sushant S. Suryagandh, Sunnyvale, CA (US);

Judy Xilin an, Saratoga, CA (US);

Inventors:

Sushant S. Suryagandh, Sunnyvale, CA (US);

Judy Xilin An, Saratoga, CA (US);

Assignee:

GlobalFoundries Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for operating an integrated circuit tester information processing system includes measuring current information from test structures for an integrated circuit having dual stress liners; selecting currents from the current information or stored current information; deriving a scaling factor with the currents for a stress contribution based on an active area of a circuit element in the integrated circuit; and correlating the stress contribution with the integrated circuit.


Find Patent Forward Citations

Suryagandh, Sushant. (2009). Integrated circuit tester information processing system (U.S. Patent No. 7610160). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7610160

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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