The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
Nov. 10, 2003
Leonard W. Winchester, Jr., Yorktown, VA (US);
Nee-yin Chou, Yorktown, VA (US);
Leonard W. Winchester, Jr., Yorktown, VA (US);
Nee-Yin Chou, Yorktown, VA (US);
WinTec, LLC, Yorktown, VA (US);
Abstract
Infrared and Raman spectroscopy methods are used to assess the tension of ligaments, tendons and other tissue. The device includes an electromagnetic radiation source for directing radiation energy onto a sample, either directly or using a probe. Between the radiation source and the sample, emitted electromagnetic energies pass through a filtering device and are directed to the sample using optical components such as mirrors, lenses and optical fibers. After impacting the tissue, scattered emissions are collected by a collecting lens at a predetermined geometry. The scattered emissions are collected by a collection means such as lens and optical fibers directed to another filtering device and a spectrum-analyzing device, and detected with a photon-detecting device. The collected scattering signals are analyzed using a computing device such as a computer or a microprocessor. The tension in the tissue is obtained from the analysis of the scattered emissions.