The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2009

Filed:

Dec. 29, 2004
Applicants:

Adam B. Eldredge, Austin, TX (US);

Jeffrey S. Batchelor, Austin, TX (US);

Gary Hammes, Topeka, KS (US);

Inventors:

Adam B. Eldredge, Austin, TX (US);

Jeffrey S. Batchelor, Austin, TX (US);

Gary Hammes, Topeka, KS (US);

Assignee:

Silicon Laboratories Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention includes apparatus and methods to calibrate a phase detector and an analog-to-digital converter (ADC) offset and gain. In one such embodiment, an apparatus includes a phase detector to generate an error pulse and a reference pulse, a combiner to combine the pulses, and an ADC to receive the combined pulses, where the ADC has a full scale set by an average of the reference pulse. Still further, a calibration loop may be coupled between the output of the ADC and the phase detector to generate and provide a phase adjust signal to reduce or eliminate phase offsets. Other embodiments are described and claimed.


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