The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
Sep. 29, 2005
Dietrich Meier, Niedererlinsbach, CH;
Dietrich Meier, Niedererlinsbach, CH;
Leica Geosystems AG, Heerbrugg, CH;
Abstract
In a method and a measuring device () for measuring an absolute distance value corresponding with a range () between a measuring device () and a target (), wherein for measuring the absolute distance value a number of individual measuring steps are performed with an absolute distance meter (), a distance variation between the measuring device () and the target () is also measured with a relative distance meter () at least approximately simultaneously with these individual measuring steps and the distance variation is taken into account as the absolute distance is being determined. Preferably an iterative method comprising several sampling steps is used for measuring the absolute distance, e.g. according to the Fizeau method, wherein an output value (A) is generated from an input value (f, f, f, . . . ) and measured in each sampling step. The output value (A) is dependent on the input value (f, f, f, . . . ) and on the distance.