The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2009

Filed:

Mar. 20, 2008
Applicant:

David Wheeler Warren, Los Angeles, CA (US);

Inventor:

David Wheeler Warren, Los Angeles, CA (US);

Assignee:

The Aerospace Corporation, El Segundo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A spectrometer apparatus includes a refractor element, a slit, a detector, a diffraction grating, and a corrector lens. The refractor element includes a rear surface and a front surface. The slit provides an optical path to the rear surface of the refractor element, and is configured to transmit an image incident thereupon along the optical path. The detector is positioned facing the rear surface of the refractor element. The diffraction grating faces the front surface of the refractor element, and is configured to spectrally disperse and reimage the image of the slit toward the front surface of the refractor element. The corrector lens is positioned between the refractor element and the diffraction grating such that the image is provided to the detector corrected for a spherical aberration caused by a separation distance between the detector and the rear surface of the refractor element.


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