The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
Nov. 02, 2005
Tadashi Kajino, Okazaki, JP;
Tadashi Kajino, Okazaki, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
A lens meter for measuring optical characteristics of a lens to be measured includes a measurement optical system including a light source which projects a measurement light beam to the lens and a light receiving sensor which receives the measurement light beam having passed through the lens; an arithmetic part which obtains optical characteristic distribution of a predetermined measurement region of the lens based on a light reception result of the light receiving sensor; near-vision-portion determination means which determines whether a near vision portion of the lens is present in the measurement region based on the optical characteristic distribution in the measurement region; and detection means which detects presence of a non-optical region in addition to an optical region of the lens in the measurement region based on the light reception result of the light receiving sensor; the arithmetic part obtains additional power of the lens based on the optical characteristic distribution of the optical region in the measurement region when the near-vision-portion determination means does not determine the presence of the near vision portion in the measurement region and the detection means detects the presence of the non-optical region in the measurement region.