The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
Mar. 07, 2008
Michael Jeck, Mainz, DE;
Frank Gumbmann, Oberreichenbach, DE;
Lorenz-peter Schmidt, Hessdorf, DE;
Hue-phat Tran, Erlangen, DE;
Jochen Weinzierl, Nuremberg, DE;
Michael Jeck, Mainz, DE;
Frank Gumbmann, Oberreichenbach, DE;
Lorenz-Peter Schmidt, Hessdorf, DE;
Hue-Phat Tran, Erlangen, DE;
Jochen Weinzierl, Nuremberg, DE;
Smiths Heimann GmbH, Wiesbaden, DE;
Abstract
A method for imaging test objects by means of electromagnetic waves, in particular for the purpose of checking individuals for suspicious articles, in which method the test object is illuminated by electromagnetic waves, the scattered waves are received and evaluated for an imaginal representation of the test object on the basis of the synthetic aperture principle (SAR). A synthetic aperture is produced by the waves output by an antenna being concentrated initially in spatial terms, the point of high concentration being moved on a reflector along a circle.