The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
May. 28, 2008
Shih-fang Wong, Taipei Hsien, TW;
Jiang-feng Shan, Shenzhen, CN;
Tsung-jen Chuang, Taipei Hsien, TW;
Wen-wu Wang, Shenzhen, CN;
Shih-Fang Wong, Taipei Hsien, TW;
Jiang-Feng Shan, Shenzhen, CN;
Tsung-Jen Chuang, Taipei Hsien, TW;
Wen-Wu Wang, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
A testing system for measuring an electronic device includes a main controller for generating a control signal, a signal generator for outputting a predetermined test input signal according to the control signal, an instrument unit having a plurality of instruments, and a testing port having a plurality of probes. The plurality of probes connects corresponding testing points of the electronic device to the signal generator and the instruments. The predetermined test input signal is transmitted to the electronic device via the testing port. The instrument unit processes a test result signal outputted by the electronic device and outputs a result data. The main controller receives the result data and computes whether the result data is within a predetermined range. A related testing method is also provided.