The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2009

Filed:

Dec. 21, 2007
Applicants:

Kyung Young Kim, Portland, OR (US);

David William Newton, Tualatin, OR (US);

Inventors:

Kyung Young Kim, Portland, OR (US);

David William Newton, Tualatin, OR (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an electronic testing machine including at least one test module having a plurality of contacts for testing electronic components, the improvement of a contact alignment tool for aligning the contacts is taught. The tool includes a body to be positioned relative to the machine such that the body can be radially indexed along a path to a test position proximate the contacts and a plurality of circuits associated with the body. Each circuit includes at least one output signal connection and at least one open contact station. Each station is defined by at least one open circuit trace pattern and is closed by the contacts when the body is located at the test position and the contacts are properly aligned. A method and apparatus for aligning contacts of an electronic testing machine are also taught.


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