The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
Dec. 16, 2003
Hendrik Derks, Geretsried, DE;
Matthias Hecht, Ottobrunn, DE;
Norbert Holl, Germering, DE;
Nikolai Lipkowitsch, München, DE;
Dieter Stein, Holzkirchen, DE;
Holger Trumpfheller, München, DE;
Bernd Wunderer, München, DE;
Hendrik Derks, Geretsried, DE;
Matthias Hecht, Ottobrunn, DE;
Norbert Holl, Germering, DE;
Nikolai Lipkowitsch, München, DE;
Dieter Stein, Holzkirchen, DE;
Holger Trumpfheller, München, DE;
Bernd Wunderer, München, DE;
Giesecke & Devrient GmbH, Munich, DE;
Abstract
A method and an apparatus for checking bank notes, in which data from at least two different measurings of the bank notes to be checked are evaluated. Bank notes are checked, whereby data from at least two different measurings of bank notes to be checked are evaluated, a first property of the bank note to be checked being derived from the data of at least one first measuring, at least one second property of the bank note to be checked being derived from the data of at least one second measuring. A correlation between the first and the second property for the same places on the bank note to be checked is determined, and the first property is derived once again. For the places of the bank note to be checked, for which a correlation between first and at least second property has been determined, an altered derivation of the first property from the data of the at least first measuring is performed.