The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2009

Filed:

Apr. 26, 2005
Applicants:

Trishul Chilimbi, Seattle, WA (US);

Erez Perelman, La Jolla, CA (US);

Inventors:

Trishul Chilimbi, Seattle, WA (US);

Erez Perelman, La Jolla, CA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A run time software test tool instruments a program to perform a low overhead profiling of the program's execution, which records the execution time of frequent acyclic control flow paths using hardware performance counters. An analysis of the profiling data is performed to identify those program paths that have significant variation in execution time across different dynamic traversals in the same program run. This variation (measured as the difference between the fastest execution of that path and slower executions) represents the potential speedup that potentially could be achieved if the paths were optimized (such as by the addition of simple pre-fetch optimizations) to do away with these variations. The variational paths are identified to the programmer to guide optimization.


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