The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2009
Filed:
Feb. 09, 2007
Andrew D. Foland, Cambridge, MA (US);
Richard Franklin Eilbert, Lincoln, MA (US);
Boris Oreper, Newton, MA (US);
Nikolay Rolshud, Winchester, MA (US);
Prabhav Morje, Reading, MA (US);
Andrew D. Foland, Cambridge, MA (US);
Richard Franklin Eilbert, Lincoln, MA (US);
Boris Oreper, Newton, MA (US);
Nikolay Rolshud, Winchester, MA (US);
Prabhav Morje, Reading, MA (US);
L-3 Communications Security and Detection Systems Inc., Woburn, MA (US);
Abstract
A method for operating an inspection system is disclosed in which an item under inspection may be moved between radiation sources and detectors illuminated by the sources. The radiation sources may be positioned such that radiation from at least some of the sources impinge on the radiation detectors, forming acute angles with respect to a plane having a normal direction coinciding with the first direction that are substantially in excess of three degrees. Data accumulated by the radiation detectors may be processed to form a three-dimensional tomographic data image of at least a portion of the item under inspection. The processing may be performed using an algebraic reconstruction technique using an inverse system matrix. The inverse matrix can be derived without first computing a transpose of the system matrix.